18 September 1996 Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip
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Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250781
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
Abstract
We present first results with a reflection mode SNOM, which uses a tetrahedral tip as an apertureless near-field probe. The SNOM was driven together with an STM to control the tip- surface distance in order to avoid mechanical damage of the tip.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Ferber, U. C. Fischer, J. Koglin, Harald Fuchs, "Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250781; https://doi.org/10.1117/12.250781
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