18 September 1996 Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip
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Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250781
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
Abstract
We present first results with a reflection mode SNOM, which uses a tetrahedral tip as an apertureless near-field probe. The SNOM was driven together with an STM to control the tip- surface distance in order to avoid mechanical damage of the tip.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
J. Ferber, J. Ferber, U. C. Fischer, U. C. Fischer, J. Koglin, J. Koglin, Harald Fuchs, Harald Fuchs, } "Reflection mode scanning near-field optical microscope (SNOM) with the tetrahedral tip", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); doi: 10.1117/12.250781; https://doi.org/10.1117/12.250781
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