Paper
18 September 1996 Speckle pattern correlation for local approach of damage evaluation
Pierre R. Slangen, Patrick Ienny, Max Nemoz-Gaillard
Author Affiliations +
Proceedings Volume 2782, Optical Inspection and Micromeasurements; (1996) https://doi.org/10.1117/12.250771
Event: Lasers, Optics, and Vision for Productivity in Manufacturing I, 1996, Besancon, France
Abstract
Optical techniques because there are no-contact and non intrusive methods are well suited for non destructive testing and for damage evaluation. Image correlation is well suited in mesoscopic approach between successive steps of deformation and can be achieved if the object under study is carrying a characteristic pattern. As a characteristic pattern the white light image of the object surface or the subjective speckle generated by coherent illumination of an optically rough object can be used. The image is then grabbed by a high resolution CCD camera. Instead of using a defined mesh on the object, image correlation allows dynamic link of a point to a pixels pattern called the correlation window. While applying stress or strain, points of the object surface are moving. Between each step of deformation the correlation window and the mesh are then updated. While using a tensile test apparatus the rigid body motion is compensated by moving the CCD camera on a parallel axis to keep the region of interest into the field of view. All the operations are computer-controlled under data acquisition and processing software. The results are presented as in- plane displacement vectors and allow the determination of some mechanical values by external computing. The method is applied to damage analysis from in-situ measurements in concrete manufacture.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pierre R. Slangen, Patrick Ienny, and Max Nemoz-Gaillard "Speckle pattern correlation for local approach of damage evaluation", Proc. SPIE 2782, Optical Inspection and Micromeasurements, (18 September 1996); https://doi.org/10.1117/12.250771
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Speckle pattern

CCD cameras

Data acquisition

Image analysis

Image resolution

Manufacturing

Speckle

Back to Top