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10 June 1996 Optimization of fringe pattern scheme registration in moire topography
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Proceedings Volume 2791, Photomechanics '95; (1996)
Event: Photomechanics '95, 1995, Novosibirsk, Russian Federation
The new equations, which describe the relation between the characteristics of optical scheme, sensibility and the depth of focus in moire topography, were obtained. Possibility of optimization of the registration scheme of fringe pattern was discussed. The examples of method application, in which the grating is projected on the investigated surface and this surface with image of that grating are projected to the reference grating, are presented. The examples show a good agreement between relief measured by the proposed methods and by independent means.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. M. Popov, V. B. Zinovjev, and A. V. Kolesnikov "Optimization of fringe pattern scheme registration in moire topography", Proc. SPIE 2791, Photomechanics '95, (10 June 1996);

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