6 May 1996 First realization of laser-selective projection photoelectron microscopy: study of LiF:F2 crystal surface with the subwavelength spatial resolution
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Proceedings Volume 2799, Atomic and Quantum Optics: High-Precision Measurements; (1996); doi: 10.1117/12.239851
Event: International Conference on Coherent and Nonlinear Optics, 1995, St. Petersburg, Russian Federation
Abstract
Laser photoelectron projection microscope with the magnification of 105 and spatial resolution of up to 30 nm has been developed. Photoelectron images produced due to the laser photoselective ionization of light absorbing centers on LiF:F2 needle tip surface when irradiated by cw argon ion laser have been investigated and single color centers on its surface have been observed for the first time. In some experiments spectral dependence of photoelectron image on laser radiation wavelength has been observed. The results of the experiments can be regarded as a first realization of such a surface studying method which makes it possible to study the surfaces at a high spatial resolution and at the same time to identify some specific small structures in surfaces, i.e., has a high 'chemical selectivity.'
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. N. Konopsky, S. K. Sekatskii, Vladilen S. Letokhov, "First realization of laser-selective projection photoelectron microscopy: study of LiF:F2 crystal surface with the subwavelength spatial resolution", Proc. SPIE 2799, Atomic and Quantum Optics: High-Precision Measurements, (6 May 1996); doi: 10.1117/12.239851; http://dx.doi.org/10.1117/12.239851
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KEYWORDS
Crystals

Color centers

Microscopes

Laser crystals

Spatial resolution

Argon ion lasers

Ions

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