10 June 1996 Nonlinear effects in SEW excitation in Ag/fullerene thin film structures in Kretschmann configuration
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Proceedings Volume 2801, Nonlinear Optics of Low-Dimensional Structures and New Materials; (1996); doi: 10.1117/12.242126
Event: International Conference on Coherent and Nonlinear Optics, 1995, St. Petersburg, Russian Federation
Abstract
Dependence of minimum reflectivity angle on incidence light pulse energy at SEW excitation in Kretschmann's configuration was studied. CaF2 prism covered by thin layers of Ag and fullerene was used. Optical constants of fullerene thin layer were found: (epsilon) ' equals 3.86, (epsilon) ' equals 0.013 at wavelength 1.055 micrometers .
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
N. N. Il'ichev, Yuriy Y. Petrov, V. A. Yakovlev, "Nonlinear effects in SEW excitation in Ag/fullerene thin film structures in Kretschmann configuration", Proc. SPIE 2801, Nonlinear Optics of Low-Dimensional Structures and New Materials, (10 June 1996); doi: 10.1117/12.242126; http://dx.doi.org/10.1117/12.242126
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KEYWORDS
Reflectivity

Prisms

Optical filters

Diodes

Silver

Calibration

Fullerenes

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