PROCEEDINGS VOLUME 2805
SPIE'S 1996 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 4-9 AUGUST 1996
Multilayer and Grazing Incidence X-Ray/EUV Optics III
SPIE'S 1996 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
4-9 August 1996
Denver, CO, United States
Advanced X-Ray Astrophysics Facility (AXAF)
Proc. SPIE 2805, Advanced X-Ray Astrophysics Facility (AXAF), 0000 (19 July 1996); doi: 10.1117/12.245079
Proc. SPIE 2805, Monitoring program for the coating of the AXAF flight optics, 0000 (19 July 1996); doi: 10.1117/12.245089
Poster Session
Proc. SPIE 2805, Verification of the coating performance for the AXAF flight optics based on reflectivity measurements of coated witness samples, 0000 (19 July 1996); doi: 10.1117/12.245098
Advanced X-Ray Astrophysics Facility (AXAF)
Proc. SPIE 2805, Performance modeling of grazing incidence optics with structural deformations and fabrication errors, 0000 (19 July 1996); doi: 10.1117/12.245105
Proc. SPIE 2805, ACIS UV/optical blocking filter calibration at the National Synchrotron Light Source, 0000 (19 July 1996); doi: 10.1117/12.245111
High Throughput X-Ray Telescopes
Proc. SPIE 2805, Characteristics of the flight model optics for the JET-X telescope onboard the Spectrum-X-Gamma satellite, 0000 (19 July 1996); doi: 10.1117/12.245112
Proc. SPIE 2805, Deposition and characterization of multilayers on thin foil x-ray mirrors for high-throughput x-ray telescopes, 0000 (19 July 1996); doi: 10.1117/12.245113
Proc. SPIE 2805, Soft x-ray calibration of the Co/C multilayer mirrors for the Objective Crystal Spectrometer on the Spectrum Roentgen-Gamma satellite, 0000 (19 July 1996); doi: 10.1117/12.245114
Proc. SPIE 2805, Lobster-eye x-ray telescope prototype, 0000 (19 July 1996); doi: 10.1117/12.245080
Grazing Incidence X-Ray Optics
Proc. SPIE 2805, Role of sampling errors in the specification of x-ray mirror surfaces, 0000 (19 July 1996); doi: 10.1117/12.245081
Proc. SPIE 2805, Surface characterization of an XMM mandrel at the European Synchrotron Radiation Facility: part II, 0000 (19 July 1996); doi: 10.1117/12.245082
Proc. SPIE 2805, Penta-Prism Long Trace Profiler (PPLTP) for measurement of grazing incidence space optics, 0000 (19 July 1996); doi: 10.1117/12.245083
Proc. SPIE 2805, Solar X-ray Imager (SXI) optical performance analysis, 0000 (19 July 1996); doi: 10.1117/12.245084
Proc. SPIE 2805, Subarcsecond x-ray telescope for imaging the solar corona in the 0.25- to 1.2-keV band, 0000 (19 July 1996); doi: 10.1117/12.245085
X-Ray Filters
Proc. SPIE 2805, Transmission maps of the ACIS UV/optical blocking filters, 0000 (19 July 1996); doi: 10.1117/12.245086
X-Ray Gratings, Spectrometers, and Monochromators
Proc. SPIE 2805, High-resolution grazing incidence x-ray spectrometer and its characteristics, 0000 (19 July 1996); doi: 10.1117/12.245087
Proc. SPIE 2805, High-efficiency holographic ion-etched gratings with multilayer coatings and operating on-blaze at normal incidence in the 125- to 300-A range, 0000 (19 July 1996); doi: 10.1117/12.245088
Proc. SPIE 2805, Double multilayer monochromator for harmonic rejection in the 5-to60-keV range, 0000 (19 July 1996); doi: 10.1117/12.245090
Proc. SPIE 2805, Design of stigmatic gratings for grazing incidence monochromator spectrographs, 0000 (19 July 1996); doi: 10.1117/12.245091
Zone Plates, Microchannel Plates, and Polycapillary Optics
Proc. SPIE 2805, Electromagnetic theory of multilayer gratings and zone plates, 0000 (19 July 1996); doi: 10.1117/12.245092
Proc. SPIE 2805, Characterization of x-ray polycapillary optics with a high-resolution x-ray optical bench, 0000 (19 July 1996); doi: 10.1117/12.245093
Proc. SPIE 2805, Fabrication and test of one-dimensional Bragg-Fresnel lens using Ag/Al multilayer zone plate, 0000 (19 July 1996); doi: 10.1117/12.245094
Proc. SPIE 2805, Development of capillary optics for microbeam applications with synchrotron radition, 0000 (19 July 1996); doi: 10.1117/12.245095
Proc. SPIE 2805, MCP-based x-ray collimators for lithography of semiconductor devices, 0000 (19 July 1996); doi: 10.1117/12.245096
X-Ray Telescopes, Observatories, and Missions
Proc. SPIE 2805, Diffractive-optic telescope for x-ray astronomy, 0000 (19 July 1996); doi: 10.1117/12.245097
Proc. SPIE 2805, Multilayer supermirror coating for hard x-ray telescope, 0000 (19 July 1996); doi: 10.1117/12.245099
Proc. SPIE 2805, Radiometric measurements for the purposes of the permanent space patrol of the solar EUV and soft x-ray radiation, 0000 (19 July 1996); doi: 10.1117/12.245100
Multilayer X-Ray Optics
Proc. SPIE 2805, Possibility of creation of high-quality x-ray carbon mirrors, 0000 (19 July 1996); doi: 10.1117/12.245101
Poster Session
Proc. SPIE 2805, Correlation between x-ray reflectivity measurements and surface roughness of AXAF coated witness samples, 0000 (19 July 1996); doi: 10.1117/12.245102
Proc. SPIE 2805, EUV spectrometric facility with laser-focus plasma radiation source, 0000 (19 July 1996); doi: 10.1117/12.245103
Proc. SPIE 2805, X-ray interferometry technique for mirror and multilayer characterization, 0000 (19 July 1996); doi: 10.1117/12.245104
Proc. SPIE 2805, Superfinish technology for enhanced grazing incidence reflectivity in x-ray telescopes, 0000 (19 July 1996); doi: 10.1117/12.245106
Advanced X-Ray Astrophysics Facility (AXAF)
Proc. SPIE 2805, Reflectance calibrations of AXAF witness mirrors using synchrotron radiation: 2 to 12 keV, 0000 (19 July 1996); doi: 10.1117/12.245107
Poster Session
Proc. SPIE 2805, Analysis of iridium reflectance measurements for AXAF witness mirrors from 2 to 12 keV, 0000 (19 July 1996); doi: 10.1117/12.245108
Proc. SPIE 2805, Iridium optical constants from x-ray transmission measurements over 2 to 12 keV, 0000 (19 July 1996); doi: 10.1117/12.245109
Multilayer X-Ray Optics
Proc. SPIE 2805, Soft x-ray (2 to 6 keV) spectroscopy using gratings at extreme grazing incidence, 0000 (19 July 1996); doi: 10.1117/12.245110
Back to Top