Monitoring program for the coating of the AXAF flight optics

Suzanne E. Romaine; Ricardo J. Bruni; Anna M. Clark; William A. Podgorski; D. Schultz; Daniel A. Schwartz; Leon P. Van Speybroeck; Ying Zhou; Robert Edward Hahn; George T. Johnston; Andrew J. Longmire; J. T. Humphreys; Alan P. Shapiro; R. Tjulander; E. Barinek

doi:10.1117/12.245089

19 July 1996 Monitoring program for the coating of the AXAF flight optics

Suzanne E. Romaine, Ricardo J. Bruni, Anna M. Clark, William A. Podgorski, D. Schultz, Daniel A. Schwartz, Leon P. Van Speybroeck, Ying Zhou, Robert Edward Hahn, George T. Johnston, Andrew J. Longmire, J. T. Humphreys, Alan P. Shapiro, R. Tjulander, E. Barinek

Author Affiliations +

Proceedings Volume 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III; (1996) https://doi.org/10.1117/12.245089
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The Mission Support Team SAO Reflectivities studies laboratory was responsible for the verification of the coating performance specification during the coating of the eight AXAF flight optics. Prior to the start of the coating of the flight optics, it was necessary to verify the scaleup of the coating chamber parameters from the test chamber to the flight optic coating chamber as well as to verify repeatability of coating quality. Immediately prior to the coating of each flight optic, witness samples were coated to verify the coating specification for each particular geometry. Similar witness samples were coated to verify the coating specification for each particular geometry. Similar witness samples were also coated with each flight optic. An overview of this monitoring program is presented along with a description of how the measurements are made, what tests are used to verify performance and a description of the witness sample deployment. Preliminary data on coating uniformity will also be presented.

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Suzanne E. Romaine, Ricardo J. Bruni, Anna M. Clark, William A. Podgorski, D. Schultz, Daniel A. Schwartz, Leon P. Van Speybroeck, Ying Zhou, Robert Edward Hahn, George T. Johnston, Andrew J. Longmire, J. T. Humphreys, Alan P. Shapiro, R. Tjulander, and E. Barinek "Monitoring program for the coating of the AXAF flight optics", Proc. SPIE 2805, Multilayer and Grazing Incidence X-Ray/EUV Optics III, (19 July 1996); https://doi.org/10.1117/12.245089

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