31 October 1996 Effect of the Al thickness on the performance of Nb/Al/AlOx/Al/Nb superconducting tunnel junctions used as x-ray detectors
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Abstract
Nb/Al/AlOx/Al/Nb superconducting tunnel junctions (STJs) have been studied extensively as photon detectors, because of their intrinsic capabilities in terms of charge output and energy resolving power. A critical element in such an STJ is the aluminum layer which separates the superconductive Nb from the AlOx tunnel barrier. In this paper, the role of this Al layer is investigated. The behavior of high quality STJs, differing by the Al thickness only, is analyzed. Five thicknesses ranging between 5 nm and 120 nm are considered. The charge output, the energy linearity and resolution for the case of 6 keV x-ray photons are discussed.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Abel Poelaert, Abel Poelaert, Peter Verhoeve, Peter Verhoeve, Nicola Rando, Nicola Rando, Anthony J. Peacock, Anthony J. Peacock, D. J. Goldie, D. J. Goldie, R. Venn, R. Venn, } "Effect of the Al thickness on the performance of Nb/Al/AlOx/Al/Nb superconducting tunnel junctions used as x-ray detectors", Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); doi: 10.1117/12.256025; https://doi.org/10.1117/12.256025
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