Translator Disclaimer
31 October 1996 Radiation damage of the x-ray CCD
Author Affiliations +
Abstract
We studied the proton damage effects of the x-ray CCD. We have measured x-ray CCD performances after the irradiation of energies at 2 and 9.5 MeV, and confirmed clear degradation of charge transfer efficiency (CTE) and the energy resolution. To recover degraded CTE and the energy resolution, we tried the charge injection technique, and found the improvement of CTI and the energy resolution to be one-quarter and one-third, respectively. We also estimated the energy level of the deep trap, which causes the quantization of the dark current from the radiation-damaged pixels. The trap energy level is about 0.57 eV, or near the center of forbidden band.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroshi Tomida, Hironori Matsumoto, Masanobu Ozaki, Yuji Tazawa, Hisamitsu Awaki, Takeshi G. Tsuru, Katsuji Koyama, Hiroshi Tsunemi, and Koei Yamamoto "Radiation damage of the x-ray CCD", Proc. SPIE 2808, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy VII, (31 October 1996); https://doi.org/10.1117/12.255999
PROCEEDINGS
10 PAGES


SHARE
Advertisement
Advertisement
RELATED CONTENT


Back to Top