GOES landmark positioning system

Walter G. Eppler; David W. Paglieroni; Marcus Louie; Jeffrey Hanson

doi:10.1117/12.254124

18 October 1996 GOES landmark positioning system

Walter G. Eppler, David W. Paglieroni, Marcus Louie, Jeffrey Hanson

Proceedings Volume 2812, GOES-8 and Beyond; (1996) https://doi.org/10.1117/12.254124
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

This paper describes methods, algorithms, and software developed to select and represent landmarks from cartographic databases and to automatically determine the landmark position in GOES imagery. A simulation study was conducted to demonstrate that the landmark position can be measured with subpixel accuracy.

Citation Download Citation

Walter G. Eppler, David W. Paglieroni, Marcus Louie, and Jeffrey Hanson "GOES landmark positioning system", Proc. SPIE 2812, GOES-8 and Beyond, (18 October 1996); https://doi.org/10.1117/12.254124

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