22 October 1996 Required composition uniformity of Hg1-xCdxTe substrate for focal plane arrays
Author Affiliations +
Abstract
This paper presents a comparison of theoretically predicted spatial NETD and mean temporal NETD as a function of the composition uniformity of Hg1-xCdxTe substrate used in the fabrication of IR detector arrays. The prediction of the spatial NETD is based on the residual spatial noise left behind in the FPA after implementing a linear two point nonuniformity compensation algorithm. The effect of using an optical filter on the spatial NETD is also included to show that the specifications on the composition uniformity of the Hg1-xCdxTe substrate can be partially relaxed by using an optical filter whose cut-off wavelength is less than the cutoff wavelength of the photodiodes of mean response. The composition uniformity leading to temporal noise rather than the spatial noise limited performances are suggested to be indicating the required composition uniformity of Hg1-xCdxTe substrate for focal plane arrays (FPA). The results are presented for both MWIR and LWIR HgCdTe hybrid FPAs.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vishnu Gopal, Vishnu Gopal, } "Required composition uniformity of Hg1-xCdxTe substrate for focal plane arrays", Proc. SPIE 2816, Infrared Detectors for Remote Sensing: Physics, Materials, and Devices, (22 October 1996); doi: 10.1117/12.255169; https://doi.org/10.1117/12.255169
PROCEEDINGS
8 PAGES


SHARE
RELATED CONTENT

Next decade in infrared detectors
Proceedings of SPIE (October 09 2017)
HgCdTe position sensitive detector (PSD) development
Proceedings of SPIE (July 28 2010)
Advanced MCT technologies in France
Proceedings of SPIE (May 14 2007)
640 x 480 PACE HgCdTe FPA
Proceedings of SPIE (December 10 1992)

Back to Top