Fiber optic low-coherence reflectometer for process control

Paul H. Shelley; Simonida Rutar; Lloyd W. Burgess

doi:10.1117/12.260585

10 December 1996 Fiber optic low-coherence reflectometer for process control

Paul H. Shelley, Simonida Rutar, Lloyd W. Burgess

Proceedings Volume 2836, Chemical, Biochemical, and Environmental Fiber Sensors VIII; (1996) https://doi.org/10.1117/12.260585
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

A fiber optic based optical low coherence reflectometer has been investigated for process monitoring applications that include its use with both transparent and highly scattering materials. This paper addresses instrumental issues and several applications including measurement of multiple layer polymer films, paint clear coat thickness and refractive index, highly scattering paint layer thickness, and particle size analysis in liquid suspensions.

Citation Download Citation

Paul H. Shelley, Simonida Rutar, and Lloyd W. Burgess "Fiber optic low-coherence reflectometer for process control", Proc. SPIE 2836, Chemical, Biochemical, and Environmental Fiber Sensors VIII, (10 December 1996); https://doi.org/10.1117/12.260585

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