7 October 1996 Low-coherence reflectometry based on DFWM in a thin liquid layer
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Abstract
We describe a coherence filtering technique based on degenerate four wave mixing (DFWM) in a thin nonlinear optical material. In contrast to previous works which used ultra-short laser pulses, we performed low-coherence filtering techniques through scattering media with broad- spectrum nanosecond pulses. In our first 'proof of principle' experiments we used a 100 micrometer thick layer of dye solution as a nonlinear optical material and investigated a one dimensional case for depth-resolved measurements through a scattering media consisting of a highly scattering suspension of dielectric microspheres in water. We also describe a technique to obtain instantaneous cross-sectional images (which can be depth scanned to obtain the third dimension) performed with a low-coherence nanosecond laser source on a liquid crystal doped with an infrared dye. Experimental results were obtained with room temperature LiF:F2- and LiF:F2+ color center lasers, and a Q-switched alexandrite laser. This technique can be used to provide instantaneous, single-shot, two-dimensional images of the internal structure of materials versus depth.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Vladimir B. Fleurov, Vladimir B. Fleurov, Christopher M. Lawson, Christopher M. Lawson, Denise Brown-Anderson, Denise Brown-Anderson, Alex Yu. Dergachev, Alex Yu. Dergachev, Sergey B. Mirov, Sergey B. Mirov, Robert G. Lindquist, Robert G. Lindquist, } "Low-coherence reflectometry based on DFWM in a thin liquid layer", Proc. SPIE 2853, Nonlinear Optical Liquids, (7 October 1996); doi: 10.1117/12.253467; https://doi.org/10.1117/12.253467
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