PROCEEDINGS VOLUME 2856
SPIE'S 1996 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 4-9 AUGUST 1996
Optics for High-Brightness Synchrotron Radiation Beamlines II
SPIE'S 1996 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
4-9 August 1996
Denver, CO, United States
High Heat Flux Synchrotron Optics
Proc. SPIE 2856, Bonding techniques for the fabrication of internally cooled x-ray monochromators, 0000 (22 November 1996); https://doi.org/10.1117/12.259858
Source Properties and Beam Coherence
Proc. SPIE 2856, Performance optimization of synchrotron light sources, 0000 (22 November 1996); https://doi.org/10.1117/12.259877
Proc. SPIE 2856, Practical aspects of undulator radiation properties, 0000 (22 November 1996); https://doi.org/10.1117/12.259881
Proc. SPIE 2856, Coherent properties of the third-generation synchrotron radiation sources: optical requirements, 0000 (22 November 1996); https://doi.org/10.1117/12.259882
Magnifying and Microfocusing Optics
Proc. SPIE 2856, Capillary concentrators for synchrotron radiation beamlines, 0000 (22 November 1996); https://doi.org/10.1117/12.259883
Proc. SPIE 2856, R&D of the hard x-ray focusing elements for the SPring-8 beamlines, 0000 (22 November 1996); https://doi.org/10.1117/12.259849
Proc. SPIE 2856, X-ray focusing using elliptically bent multilayers, 0000 (22 November 1996); https://doi.org/10.1117/12.259850
Proc. SPIE 2856, X-ray diffraction properties of highly oriented pyrolytic graphite, 0000 (22 November 1996); https://doi.org/10.1117/12.259851
High-Energy and High-Q Resolution Optics
Proc. SPIE 2856, Polarization optics for high-brightness synchrotron x rays, 0000 (22 November 1996); https://doi.org/10.1117/12.259852
Proc. SPIE 2856, Performance of the VUV high-resolution and high-flux beamline for chemical dynamics studies at the Advanced Light Source, 0000 (22 November 1996); https://doi.org/10.1117/12.259853
Proc. SPIE 2856, Considerations for a soft x-ray spectromicroscopy beamline, 0000 (22 November 1996); https://doi.org/10.1117/12.259854
Proc. SPIE 2856, Laterally graded Si1-xGex crystals for high-resolution synchrotron x-ray optics, 0000 (22 November 1996); https://doi.org/10.1117/12.259855
Proc. SPIE 2856, Optimization software for XUV monochromators, 0000 (22 November 1996); https://doi.org/10.1117/12.259856
Poster Session
Proc. SPIE 2856, Design analyses with XRAP for PETRA/HASYLAB beamline filters/windows, 0000 (22 November 1996); https://doi.org/10.1117/12.259857
Proc. SPIE 2856, Monolithic silicon x-ray interferometer with varying mirror-analyzer spacing for the analysis of beam coherence, 0000 (22 November 1996); https://doi.org/10.1117/12.259859
Proc. SPIE 2856, Elliptically polarizing undulator beamline 4.0.1 for magnetic spectroscopy at the Advanced Light Source, 0000 (22 November 1996); https://doi.org/10.1117/12.259860
Proc. SPIE 2856, Design of a high-resolution step-and-scan type monochromator capable of tuning to undulator radiation over a wavelength range of 80-180 nm, 0000 (22 November 1996); https://doi.org/10.1117/12.259861
Proc. SPIE 2856, Simple x-ray focusing mirror using float glass, 0000 (22 November 1996); https://doi.org/10.1117/12.259862
Proc. SPIE 2856, Status of the optical metrology at the ESRF, 0000 (22 November 1996); https://doi.org/10.1117/12.259863
Proc. SPIE 2856, Ultraprecision grinding of chemical vapor-deposited silicon carbide mirrors for synchrotron radiation, 0000 (22 November 1996); https://doi.org/10.1117/12.259864
Proc. SPIE 2856, Preliminary optical design of a varied line-space spectrograph for the multichannel detection of Near-Edge X-ray Absorption Fine Structure (NEXAFS) spectra in the 280- to 550-eV energy range, 0000 (22 November 1996); https://doi.org/10.1117/12.259865
Figure Tailoring
Proc. SPIE 2856, R&D program on bimorph mirrors at the ESRF, 0000 (22 November 1996); https://doi.org/10.1117/12.259866
Proc. SPIE 2856, New schemes for producing high-accuracy elliptical x-ray mirrors by elastic bending, 0000 (22 November 1996); https://doi.org/10.1117/12.259867
Proc. SPIE 2856, Controlling gravitational distortions in long synchrotron x-ray mirrors, 0000 (22 November 1996); https://doi.org/10.1117/12.259868
Proc. SPIE 2856, Bent crystal analyzer without grooves for inelastic scattering: first experimental results, 0000 (22 November 1996); https://doi.org/10.1117/12.259869
Controls, Diagnostics, Metrology, Production Methods, and Technology
Proc. SPIE 2856, Advantages of in-situ LTP distortion profile test on high heat load mirrors and applications, 0000 (22 November 1996); https://doi.org/10.1117/12.259870
Proc. SPIE 2856, In-situ surface monitoring system for synchrotron mirrors under high heat load, 0000 (22 November 1996); https://doi.org/10.1117/12.259871
Proc. SPIE 2856, Active bimorph structure for x-ray gratings and mirrors, 0000 (22 November 1996); https://doi.org/10.1117/12.259872
Proc. SPIE 2856, Scanning probe microscopy and how it can be utilized in the manufacture of diffraction gratings, 0000 (22 November 1996); https://doi.org/10.1117/12.259873
Proc. SPIE 2856, Precision motion and position control for the Plane Grating Monochromator at SRC, 0000 (22 November 1996); https://doi.org/10.1117/12.259874
Proc. SPIE 2856, New beamline optics of the x-ray undulator BW1 at DORIS, 0000 (22 November 1996); https://doi.org/10.1117/12.259875
Poster Session
Proc. SPIE 2856, Vertically focusing reflective optics using two bendable CVD SiC mirrors, 0000 (22 November 1996); https://doi.org/10.1117/12.259876
High Heat Flux Synchrotron Optics
Proc. SPIE 2856, Significant improvements in Long Trace Profiler measurement performance, 0000 (22 November 1996); https://doi.org/10.1117/12.259878
Proc. SPIE 2856, Monochromators for small cross-section x-ray beams from high heat flux synchrotron sources, 0000 (22 November 1996); https://doi.org/10.1117/12.259879
Proc. SPIE 2856, Contact-cooled U-monochromators for high-heat-load x-ray beamlines, 0000 (22 November 1996); https://doi.org/10.1117/12.259880
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