In-situ surface monitoring system for synchrotron mirrors under high heat load

Peter H. Mui; George Srajer; Dennis M. Mills

doi:10.1117/12.259871

22 November 1996 In-situ surface monitoring system for synchrotron mirrors under high heat load

Peter H. Mui, George Srajer, Dennis M. Mills

Proceedings Volume 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II; (1996) https://doi.org/10.1117/12.259871
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

A portable electro-optical system capable of real-time measurements of surface distortions down to 0.5 (mu) rad is described, limited primarily by the short-term system stability. Methods to reduce the system fluctuations and to enhance the detectable resolution are explained. Although designed for use with mirrors for synchrotron radiation sources, this system has the flexibility to be applied to other optical components. The prototype system has been tested on a sample mirror piece, and preliminary results are presented. A brief discussion about the extension of this metrology unit to adaptive optics is also given.

Citation Download Citation

Peter H. Mui, George Srajer, and Dennis M. Mills "In-situ surface monitoring system for synchrotron mirrors under high heat load", Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); https://doi.org/10.1117/12.259871

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