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22 November 1996 Monolithic silicon x-ray interferometer with varying mirror-analyzer spacing for the analysis of beam coherence
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Abstract
A Laue-Laue-Laue x-ray interferometer with the inclined third crystal plate was fabricated to demonstrate wavefront- dividing interferometry in x-ray region. Observed interference patterns showed the effects of spatial coherence of the incident wave, in addition to the incident angle dependent spatial fringes expected from the dynamical theory of diffraction. From the visibility of the interference pattern, the source size used was estimated using Van Cittert-Zernike theorem.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroshi Yamazaki and Tetsuya Ishikawa "Monolithic silicon x-ray interferometer with varying mirror-analyzer spacing for the analysis of beam coherence", Proc. SPIE 2856, Optics for High-Brightness Synchrotron Radiation Beamlines II, (22 November 1996); https://doi.org/10.1117/12.259859
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