Perturbation methods in field and transfer matrix calculation: an extension of analytical methods in electron optics

Mikhail Igorevitch Yavor

doi:10.1117/12.255504

25 October 1996 Perturbation methods in field and transfer matrix calculation: an extension of analytical methods in electron optics

Mikhail Igorevitch Yavor

Author Affiliations +

Proceedings Volume 2858, Charged-Particle Optics II; (1996) https://doi.org/10.1117/12.255504
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The paper discusses a possibility of application of perturbation methods to calculation of field distributions and optical properties of various electron and ion optical systems.

Citation Download Citation

Mikhail Igorevitch Yavor "Perturbation methods in field and transfer matrix calculation: an extension of analytical methods in electron optics", Proc. SPIE 2858, Charged-Particle Optics II, (25 October 1996); https://doi.org/10.1117/12.255504

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