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25 October 1996 Perturbation methods in field and transfer matrix calculation: an extension of analytical methods in electron optics
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Abstract
The paper discusses a possibility of application of perturbation methods to calculation of field distributions and optical properties of various electron and ion optical systems.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mikhail Igorevitch Yavor "Perturbation methods in field and transfer matrix calculation: an extension of analytical methods in electron optics", Proc. SPIE 2858, Charged-Particle Optics II, (25 October 1996); https://doi.org/10.1117/12.255504
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