19 July 1996 Analysis of capillary optic performance for hard x rays
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Abstract
A geometrical optics simulation program which includes roughness and waviness effects has been developed to analyze the performance of polycapillary x-ray optics in the energy regime 10-80 keV. The simulation was in excellent agreement with previous experimental results. The calculations showed that low energy x-ray performance is sensitive to roughness while high energy x-ray performance is affected by waviness and profile error (bending). Despite the low critical angle for total external reflection at high energies, capillary x- ray optics appear promising for many hard x-ray applications. Transmission measurements at high energies have also proven to be a very sensitive tool in capillary quality analysis.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Lei Wang, Lei Wang, Bimal K. Rath, Bimal K. Rath, Walter M. Gibson, Walter M. Gibson, John C. Kimball, John C. Kimball, Carolyn A. MacDonald, Carolyn A. MacDonald, } "Analysis of capillary optic performance for hard x rays", Proc. SPIE 2859, Hard X-Ray/Gamma-Ray and Neutron Optics, Sensors, and Applications, (19 July 1996); doi: 10.1117/12.245138; https://doi.org/10.1117/12.245138
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