17 July 1996 Optoelectronic developments in speckle interferometry
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Abstract
Speckle interferomeiry is now being used extensively in a range of engineering metrology applications. This paper reviews how developments in optoelectronic technology, such as solid state laser sources and optical fibre, have led to advances in the measurement capability of speckle interferometer systems. Examples are presented of surface profile, surface slope, static displacement and displacement gradient, and vibration measurement including heterodyning and stroboscopic techniques.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ralph P. Tatam, Ralph P. Tatam, } "Optoelectronic developments in speckle interferometry", Proc. SPIE 2860, Laser Interferometry VIII: Techniques and Analysis, (17 July 1996); doi: 10.1117/12.276306; https://doi.org/10.1117/12.276306
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