PROCEEDINGS VOLUME 2861
SPIE'S 1996 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION | 4-9 AUGUST 1996
Laser Interferometry VIII: Applications
SPIE'S 1996 INTERNATIONAL SYMPOSIUM ON OPTICAL SCIENCE, ENGINEERING, AND INSTRUMENTATION
4-9 August 1996
Denver, CO, United States
New Hybrid Trends in Applications
Strain, Stress, and Vibration Measurements
Proc. SPIE 2861, Composite-embedded highly birefringent optical fiber strain gauge with zero thermal-apparent strain, 0000 (19 July 1996); doi: 10.1117/12.245167
Proc. SPIE 2861, Fast residual stress determination of welded joints using reversible holographic interferometric (RHI) film, 0000 (19 July 1996); doi: 10.1117/12.245181
Proc. SPIE 2861, Vibration analysis and nondestructive testing by digital shearography, 0000 (19 July 1996); doi: 10.1117/12.245182
Displacement Measurements
Proc. SPIE 2861, High-sensitivity displacement measurement using a novel fiber optic electronically scanned white light interferometer, 0000 (19 July 1996); doi: 10.1117/12.245183
Proc. SPIE 2861, Aspects of the use of self-mixing interference in laser diodes for displacement sensing, 0000 (19 July 1996); doi: 10.1117/12.245184
Proc. SPIE 2861, Three-dimensional displacement analysis by projected fringes and speckle correlation, 0000 (19 July 1996); doi: 10.1117/12.245153
Shape Measurements
Proc. SPIE 2861, Phase-shifting techniques applied to unique applications, 0000 (19 July 1996); doi: 10.1117/12.245154
Proc. SPIE 2861, Realization and accuracy of a phase-shifting speckle interferometer for full 3D shape measurement, 0000 (19 July 1996); doi: 10.1117/12.245155
Proc. SPIE 2861, Multiaperture overlap-scanning technique for moire metrology, 0000 (19 July 1996); doi: 10.1117/12.245156
High-Resolution, Shock, and Temperature Measurements
Proc. SPIE 2861, Ultrahigh resolution interferometry, 0000 (19 July 1996); doi: 10.1117/12.245157
Proc. SPIE 2861, Measurements of transonic shock structures using shearography, 0000 (19 July 1996); doi: 10.1117/12.245158
Proc. SPIE 2861, Scanning laser speckle photography for temperature field measurement in fluid flows, 0000 (19 July 1996); doi: 10.1117/12.245160
Proc. SPIE 2861, Moire tomography by ART, 0000 (19 July 1996); doi: 10.1117/12.245161
Dynamic and Flow Field Measurements
Proc. SPIE 2861, Computer-controlled active phase stabilization for electronic holography, 0000 (19 July 1996); doi: 10.1117/12.245162
Proc. SPIE 2861, Real-time interferometric analysis of spinning liquid films, 0000 (19 July 1996); doi: 10.1117/12.245163
Thin Films and NDE Measurements
Proc. SPIE 2861, Nondestructive quantitative 3D characterization of a car brake, 0000 (19 July 1996); doi: 10.1117/12.245164
Proc. SPIE 2861, Interferometric analysis of strained thin silicon films, 0000 (19 July 1996); doi: 10.1117/12.245165
Proc. SPIE 2861, Electro-optic interferometry for study of carbon deposition on transition metal surfaces: preliminary results, 0000 (19 July 1996); doi: 10.1117/12.245166
Proc. SPIE 2861, New method for measuring the thickness and shape of a thin film simultaneously by combining interferometry and laser triangulation, 0000 (19 July 1996); doi: 10.1117/12.245168
Materials Measurements
Proc. SPIE 2861, Novel material studies by automatic grating interferometry, 0000 (19 July 1996); doi: 10.1117/12.245169
Proc. SPIE 2861, Recognition by synthesis: a new approach for the recognition of material faults in HNDE, 0000 (19 July 1996); doi: 10.1117/12.245170
Proc. SPIE 2861, Fault detection and classification in and on transparent films by light scattering, 0000 (19 July 1996); doi: 10.1117/12.245171
Proc. SPIE 2861, Measurement of the ac impedance of aluminum samples by holographic interferometry, 0000 (19 July 1996); doi: 10.1117/12.245172
Poster Presentations
Proc. SPIE 2861, Recent applications of TV holography and shearography, 0000 (19 July 1996); doi: 10.1117/12.245173
Proc. SPIE 2861, New simple ESPI configurations for deformation studies on large structures based on diffused reference beam, 0000 (19 July 1996); doi: 10.1117/12.245174
Proc. SPIE 2861, In-process laser diode heterodyne profilometer with moving-coil objective lens, 0000 (19 July 1996); doi: 10.1117/12.245175
Proc. SPIE 2861, New type of common-path heterodyne profilometer, 0000 (19 July 1996); doi: 10.1117/12.245176
Proc. SPIE 2861, Measurements of dew droplets deposited on a metal plate by using an interference microscope with laser light, 0000 (19 July 1996); doi: 10.1117/12.245177
Proc. SPIE 2861, Laser sizing of fine particulates, 0000 (19 July 1996); doi: 10.1117/12.245178
Proc. SPIE 2861, Simple laser interferometers for testing optics, 0000 (19 July 1996); doi: 10.1117/12.245179
Proc. SPIE 2861, Optimization of polishing parameters in computer-controlled optical polishing process, 0000 (19 July 1996); doi: 10.1117/12.245180
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