Flashlamp measurement of the MSX particulate environment

Gary E. Galica; B. David Green; John J. Atkinson; Giuseppe Aurilio; Orr Shepherd; Jeffrey C. Lesho; O. Manuel Uy

doi:10.1117/12.258307

11 November 1996 Flashlamp measurement of the MSX particulate environment

Gary E. Galica, B. David Green, John J. Atkinson, Giuseppe Aurilio, Orr Shepherd, Jeffrey C. Lesho, O. Manuel Uy

Proceedings Volume 2864, Optical System Contamination V, and Stray Light and System Optimization; (1996) https://doi.org/10.1117/12.258307
Event: SPIE's 1996 International Symposium on Optical Science, Engineering, and Instrumentation, 1996, Denver, CO, United States

Abstract

The xenon flashlamp is one of a suite of instruments that monitor the particulate and gaseous contamination environments of the midcourse space experiment (MSX) spacecraft. The near-field particulate measurement comprises the high intensity xenon flashlamp that illuminates a volume of space in the field of view of the UVISI wide field of view visible imager (UVISI IVW). Radiation scattered by illuminated contaminant particles is imaged by the IVW. The intensity of the radiation is related to a particle's size and composition. The particle's track yields information about its velocity and trajectory. From ground calibration data we estimate a sensitivity to detect particles smaller than 1 micrometer and to determine cross-field velocities from 1 mm/sec to 50 m/sec. The visible radiation measurement of the particulate environment provided by the xenon flashlamp and UVISI IVW is complemented by multiband IR, UV, and visible measurements by other MSX sensors. The early mission data from this experiment will quantify the relationship between ground contamination control measures, the on-orbit contamination environment, and the performance history of on-orbit sensors.

Citation Download Citation

Gary E. Galica, B. David Green, John J. Atkinson, Giuseppe Aurilio, Orr Shepherd, Jeffrey C. Lesho, and O. Manuel Uy "Flashlamp measurement of the MSX particulate environment", Proc. SPIE 2864, Optical System Contamination V, and Stray Light and System Optimization, (11 November 1996); https://doi.org/10.1117/12.258307

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