3D diffuse object profilometry based on analysis of intensity of the grating pattern

Zheng-Feng Hu; Cheng-Lin Luo; Jian-Qin Zhou

doi:10.1117/12.263029

31 December 1996 3D diffuse object profilometry based on analysis of intensity of the grating pattern

Zheng-Feng Hu, Cheng-Lin Luo, Jian-Qin Zhou

Proceedings Volume 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96); (1996) https://doi.org/10.1117/12.263029
Event: International Conference on Holography and Optical Information Processing, 1996, Nanjing, China

Abstract

By analyzing the intensity of grating pattern we investigated a technique for automatic 3D shape measurement. Phase reduction is based on analyzing the intensity of the grating pattern which is produced by divergent illumination. Only one image pattern is sufficient and the technique is very simple. It has the nature of fast and accurate. The paper presents theoretical simulation and experimental results.

Citation Download Citation

Zheng-Feng Hu, Cheng-Lin Luo, and Jian-Qin Zhou "3D diffuse object profilometry based on analysis of intensity of the grating pattern", Proc. SPIE 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96), (31 December 1996); https://doi.org/10.1117/12.263029

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