31 December 1996 Statistical theory on holographic and speckle metrology
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Proceedings Volume 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96); (1996) https://doi.org/10.1117/12.263096
Event: International Conference on Holography and Optical Information Processing, 1996, Nanjing, China
Abstract
In this paper, the basic view points and methods of statistical metrological theory to holographic and speckle metrology are reviewed. As an example, the statistical theory is applied to quasi-heterodyne holographic interferometry. The results reveal the relation between fringe distribution and system parameters and the relation between measuring accuracy and system errors. From this example, it can be found that statistical metrological theory is superior that the conventional geometrical theory.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qiang Fang, Qiang Fang, Jiabi Chen, Jiabi Chen, "Statistical theory on holographic and speckle metrology", Proc. SPIE 2866, International Conference on Holography and Optical Information Processing (ICHOIP '96), (31 December 1996); doi: 10.1117/12.263096; https://doi.org/10.1117/12.263096
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