27 February 1997 Position-sensitive neutron detector based on dynamic RAM devices
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Proceedings Volume 2867, International Conference Neutrons in Research and Industry; (1997) https://doi.org/10.1117/12.267851
Event: Fifth International Conference on Applications of Nuclear Techniques: Neutrons in Research and Industry, 1996, Crete, Greece
Commercial dynamic Random Access Memory (dRAM) chips can offer a simple approach for the detection of neutrons. Indeed, ionizing radiation induced errors in the stored data of these silicon based memory deices provided the foundation for a new type of generic radiation sensor with the potential of high spatial resolution. Experiments were carried out and a MOnte Carlo program has been used to examine the response of the dynamic memory structures by which the sensitivity of dRAMs to neutrons can be increased. The aim of this paper is to present recent results and to discuss the capabilities of such a neutron detecting deice.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dimitra G. Darambara, Dimitra G. Darambara, Nicholas M. Spyrou, Nicholas M. Spyrou, } "Position-sensitive neutron detector based on dynamic RAM devices", Proc. SPIE 2867, International Conference Neutrons in Research and Industry, (27 February 1997); doi: 10.1117/12.267851; https://doi.org/10.1117/12.267851


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