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20 November 1996 Characterization of laser optics
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Proceedings Volume 2870, Third International Workshop on Laser Beam and Optics Characterization; (1996) https://doi.org/10.1117/12.259941
Event: Third International Workshop on Laser Beam and Optics Characterization, 1996, Quebec City, Canada
Abstract
Characterization techniques that are appropriate for detecting surface topographic features on ultra-smooth laser optics are described. Thee include various types of microscopes, optical and mechanical profilers, and instruments to measure light scattering. Two special techniques are emphasized -- total internal reflection microscopy (TIRM) and scanning force microscopy (SFM). The importance of keeping laser optics contamination-free is emphasized.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jean M. Bennett "Characterization of laser optics", Proc. SPIE 2870, Third International Workshop on Laser Beam and Optics Characterization, (20 November 1996); https://doi.org/10.1117/12.259941
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