20 November 1996 Surface-emitting laser diode beam characterization (Abstract Only)
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Proceedings Volume 2870, Third International Workshop on Laser Beam and Optics Characterization; (1996) https://doi.org/10.1117/12.259921
Event: Third International Workshop on Laser Beam and Optics Characterization, 1996, Quebec City, Canada
Abstract
We have conducted thorough analysis of a vertical-cavity surface-emitting laser (VCSEL) diode which produces TEM01* (donut) and higher-order modes. Our analysis includes the following quantities as a function of drive current: optical power, spectral content, relative intensity noise (RIN) up to 100 MHz, and beam characterization parameters. While this VCSEL produces higher-order modes which are not affected by optical feedback, its optical power (0.05 mW for TEM01*), long term stability, and sensitivity to collimating lens position make it a doubtful candidate for use in a beam characterization round robin. Also, we hope to present recently acquired data from the diode-pumped tunable transverse mode laser developed in Berlin and tested at NIST.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Richard D. Jones, Richard D. Jones, Gregory E. Obarski, Gregory E. Obarski, David J. Livigni, David J. Livigni, Holger Laabs, Holger Laabs, } "Surface-emitting laser diode beam characterization (Abstract Only)", Proc. SPIE 2870, Third International Workshop on Laser Beam and Optics Characterization, (20 November 1996); doi: 10.1117/12.259921; https://doi.org/10.1117/12.259921
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