16 August 1996 Dual-beam light-scattering tomography (LST) for detection of functional defects in nonlinear optical crystals
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Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246225
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan
Abstract
Optical nonlinearity is a very important and useful phenomenon for frequency up-conversion of laser beams and for heterodyne demodulation due to mixing of optical signals, which will be realized by high quality crystals with large conversion efficiency. Since one of the candidates is BBO (beta-BaB2O4) crystals, the light scattering from the crystals was detected by two vidicon systems under an IR laser beam scanning. Here, one of the systems is used for detection of the scattered IR rays due to defects and the other for the visible light, both of which will simultaneously acquire the scattered light intensities from the crystal.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Tomoya Ogawa, Tomoya Ogawa, Satoru Kawaai, Satoru Kawaai, Qiguang Tan, Qiguang Tan, Nobuhito Nango, Nobuhito Nango, } "Dual-beam light-scattering tomography (LST) for detection of functional defects in nonlinear optical crystals", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246225; https://doi.org/10.1117/12.246225
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