16 August 1996 Fast birefringence measurement using right and left hand circulary polarized laser
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Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246195
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan
Abstract
A fast and accurate birefringence measurement system has been built to study the in-plane birefringence of a rotating optical disk substrate. The fully automated instrument incorporates an axial Zeeman laser which emits both right and left hand circularly polarized lights, stationary polarization elements and a lock-in amplifier. Measurement results showing the accurate and fast features on the system are presented. It is also demonstrated that the in-plane birefringence mapping in rotating substrate of optical disk can be obtained by use of the ability of fast birefringence measurement.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Norihiro Umeda, Norihiro Umeda, Sho Wakayama, Sho Wakayama, Shinsuki Arakawa, Shinsuki Arakawa, Atsuo Takayanagi, Atsuo Takayanagi, Hiroyuki Kohwa, Hiroyuki Kohwa, } "Fast birefringence measurement using right and left hand circulary polarized laser", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246195; https://doi.org/10.1117/12.246195
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