16 August 1996 In-situ ellipsometric study of the phenomenon of photodoping of Ag metal As2S3 film
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Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246239
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan
Abstract
The process of photo-stimulated dissolution of Ag atom/ion into amorphous chalcogenide materials As2S3 was observed in-situ by ellipsometry. The sample was Ag/As2S3 film system which was deposited onto the glass substrate. The photodoping was proceeded by the irradiation of the light of 546:1 nm. Obtained values of ellipsometric parameters (Psi) and (Delta) were fitted by using a multilayer model. Time dependent changes of each thickness of Ag, Ag:As2S3 and As2S3 layers during the diffusion process were derived. These behaviors will be explained in relation with photodoping mechanism.
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Shuichi Kawabata, Shuichi Kawabata, Yuka Miyanishi, Yuka Miyanishi, Tsumoto Ogawa, Tsumoto Ogawa, Moriaki Wakaki, Moriaki Wakaki, } "In-situ ellipsometric study of the phenomenon of photodoping of Ag metal As2S3 film", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246239; https://doi.org/10.1117/12.246239
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