Paper
16 August 1996 Measurement of molecular orientation of polymer films during rapid elongation process by means of birefringence using phase modulation technology
Kentaro Egoshi, Yoshihiro Mochida
Author Affiliations +
Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246180
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan
Abstract
An automatic rapid elongation system for polymer films is provided in the optical birefringence measurement system using phase modulation technology. It can measure optically and dynamically modular deformation in polymer films during rapid elongation process and stress relaxation after the completion of elongation. Micro and macroscopic information on the deformation in molecules of polymer films can be obtained by measuring birefringence retardation, stress and elastic modulus as the function of time, temperature and percentage of elongation. Advantages, details of the system and some data obtained are described.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kentaro Egoshi and Yoshihiro Mochida "Measurement of molecular orientation of polymer films during rapid elongation process by means of birefringence using phase modulation technology", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); https://doi.org/10.1117/12.246180
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
Back to Top