16 August 1996 Measurement of the magneto-optical Kerr effect using a polarimetric method
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Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246177
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan
Abstract
A simple technique of measuring the polar magneto-optical Kerr effect using a rotating analyzer is developed. The technique of the rotating analyzer ellipsometer is adopted for the measurement of polarization state of light. The light intensities are digitized automatically by the simple system consisted of an analog-to-digital converter and a micro-encoder and then Fourier transformed. The expressions of rotation angle (theta) and ellipticity angle (epsilon) are obtained in terms of the Fourier coefficients of the light intensity versus rotating analyzer. This technique is applied to (theta) and (epsilon) measurement of Co/Pt films. The precision of 0.01 degree(s) in angle measurement is verified.
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Sang-Youl Kim, Hyeon Gon Lee, Y. H. Won, "Measurement of the magneto-optical Kerr effect using a polarimetric method", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246177; https://doi.org/10.1117/12.246177
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