16 August 1996 Measurement of two-dimensional birefringence distribution for laser materials
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Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246207
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan
Abstract
Such small birefringence is a serious problem for laser quality as is caused by thermal stress or residual stress in laser material. Its distribution has to be checked for manufacturing process. It is necessary for the birefringence measurement to determine the relative retardation as well as the azimuthal angle of the fast axis in an optical sample. Up to now there are some reports, but in these methods one point measurement is performed. Here a 2D birefringence measurement method is proposed using phase shifting techniques. Its accuracy is not only high enough but also high enough in speed to detect thermal effect. Eight or sixteen images are available to measure the birefringence distribution using two phase shifters such as a half-wave plate and a Babinet-Soleil compensator. This method can measure 256 X 256 values of the birefringence in short time with around 1 deg of the resolution. The minimum detectable limit is 0.02 deg by using local-sampling phase shifting technique.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yukitoshi Otani, Yukitoshi Otani, Toru Yoshizawa, Toru Yoshizawa, } "Measurement of two-dimensional birefringence distribution for laser materials", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246207; https://doi.org/10.1117/12.246207
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