16 August 1996 Method of measure the thickness of liquid crystal layer using phase plate
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Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246256
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan
Abstract
The measurement of thickness of the liquid crystal layer has been done using the optical interference method with spectrophotometer up to now. But it took more than one minute to measure the thickness, and in-line measurement was impossible. So, in this paper, the measuring method of the thickness of the liquid crystal layer that it is possible to measure the thickness at high speed for about one second is proposed, and it is reported about the principle. And we report the comparison experimental results with this method and conventional method.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Masami Ito, Masami Ito, Atsushi Fukui, Atsushi Fukui, Kanji Nishii, Kanji Nishii, Kenji Takamoto, Kenji Takamoto, } "Method of measure the thickness of liquid crystal layer using phase plate", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246256; https://doi.org/10.1117/12.246256
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