16 August 1996 Optical retardance standard: a progress report
Author Affiliations +
Proceedings Volume 2873, International Symposium on Polarization Analysis and Applications to Device Technology; (1996) https://doi.org/10.1117/12.246221
Event: International Symposium on Polarization Analysis and Applications to Device Technology, 1996, Yokohama, Japan
Abstract
The National Institute of Standards and Technology is developing a quarterwave linear retarder for operation at 1.3 micrometers . It is expected to be stable to within +/- 0.1 degree(s) over practical ranges of wavelength, temperature, and incidence angle. A spectral range of at least 10 nm is desired to accommodate solid-state and diode laser sources and typical wavelength variation. Normal incidence operation with an angular tolerance of +/- 1 degree(s) allows alignment by retroreflection of a collimated input beam. Operation over a temperature range of 25 +/- 10 degree(s)C encompasses most laboratory conditions, and practical rates of temperature change must also be allowed.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Kent B. Rochford, Allen H. Rose, Paul A. Williams, I. G. Clarke, Paul D. Hale, Gordon W. Day, "Optical retardance standard: a progress report", Proc. SPIE 2873, International Symposium on Polarization Analysis and Applications to Device Technology, (16 August 1996); doi: 10.1117/12.246221; https://doi.org/10.1117/12.246221
PROCEEDINGS
2 PAGES


SHARE
Back to Top