Paper
23 September 1996 Modeling of the performance of reflection gratings in As-S thin films photodissolved with silver
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Abstract
Analysis of reflection gratings in As-S thin films photodissolved with silver for a rectangular profile is presented. This analysis is performed by solving the scalar wave equation and by matching the amplitude of the electric and magnetic fields at the boundary of the grating with the external medium. In order to find the amplitudes of the reflected waves, an infinite system of coupled wave equations should be solved. This system of the differential equations can be put in a matrix form and the matrix of coefficients can be obtained using a Gauss elimination method. Our numerical results show that for a pure reflection grating, only the zero transmitted and reflected orders have appreciable efficiency, when the diffraction efficiency is plotted versus the grating strength parameter. Angular response of the diffraction efficiency shows that at each angle of incidence, the diffraction efficiencies of the transmitted and the reflected waves add to unity for each diffraction order. Our results show that the diffraction efficiency increases as the concentration of silver increases in the arsenic sulfide layer.
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Abdolnasser Zakery and M. Hatami "Modeling of the performance of reflection gratings in As-S thin films photodissolved with silver", Proc. SPIE 2885, Holographic Optical Elements and Displays, (23 September 1996); https://doi.org/10.1117/12.251844
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KEYWORDS
Diffraction gratings

Silver

Diffraction

Thin films

Arsenic

Metals

Dielectrics

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