30 September 1996 Large deformation measurement using ESPI
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Proceedings Volume 2888, Laser Processing of Materials and Industrial Applications; (1996); doi: 10.1117/12.253106
Event: Photonics China '96, 1996, Beijing, China
Abstract
This paper shows that the electronic speckle pattern interferometry (ESPI) using large capacity image memory makes possible to measure the large deformation distribution of a rough surface object precisely. A simple experiment to measure the large deformation of a cantilever which cannot be measured by a conventional ESPI is performed and its analysis shows the measurement error is small.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Koji Tenjimbayashi, "Large deformation measurement using ESPI", Proc. SPIE 2888, Laser Processing of Materials and Industrial Applications, (30 September 1996); doi: 10.1117/12.253106; https://doi.org/10.1117/12.253106
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KEYWORDS
Error analysis

Speckle

Speckle pattern

Fringe analysis

Head

Image analysis

Interferometry

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