Diffuse Reflectance Measurements Using Fourier Transform Infrared (FTIR) Spectroscopy

H. Witek; K. Krishnan; S. L. Hill; H. Matsumoto

doi:10.1117/12.932141

29 October 1981 Diffuse Reflectance Measurements Using Fourier Transform Infrared (FTIR) Spectroscopy

H. Witek, K. Krishnan, S. L. Hill, H. Matsumoto

Proceedings Volume 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy; (1981) https://doi.org/10.1117/12.932141
Event: 1981 International Conference on Fourier Transform Infrared Spectroscopy, 1981, Columbia, United States

Abstract

The diffuse reflectance FT-IP spectra obtained using three different accessories are compared and discussed. The presence of specularly reflected radiation in the diffuse radiation can lead to distortions of the relative band intensities in the recorded spectra. Spectral subtractions can be performed on the diffuse reflectance spectra, when the spectra are presented in the Kubelka-Munk format.

Citation Download Citation

H. Witek, K. Krishnan, S. L. Hill, and H. Matsumoto "Diffuse Reflectance Measurements Using Fourier Transform Infrared (FTIR) Spectroscopy", Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); https://doi.org/10.1117/12.932141

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