Infrared Emission Spectroscopy

P. H. G. Van Kasteren; L. H. Smeets

doi:10.1117/12.932135

29 October 1981 Infrared Emission Spectroscopy

P. H. G. Van Kasteren, L. H. Smeets

Proceedings Volume 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy; (1981) https://doi.org/10.1117/12.932135
Event: 1981 International Conference on Fourier Transform Infrared Spectroscopy, 1981, Columbia, United States

Abstract

A feasibility study performed with an unmodified FTIR spectrometer has shown that IR-emission spectroscopy is a potential analytical technique for studying surface layers. Thin layers give the best spectral contrast, while thick layers tend to resemble a black body. For quantitative analyses effects of saturation, selective reflection and self-absorption have to be taken into account.

Citation Download Citation

P. H. G. Van Kasteren and L. H. Smeets "Infrared Emission Spectroscopy", Proc. SPIE 0289, 1981 Intl Conf on Fourier Transform Infrared Spectroscopy, (29 October 1981); https://doi.org/10.1117/12.932135

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