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30 September 1996 Current-voltage characteristics of a metal-insulator-metal (MIM) element and its new band model
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Proceedings Volume 2892, Display Devices and Systems; (1996)
Event: Photonics China '96, 1996, Beijing, China
The afterimage caused by the asymmetry and shift of current- voltage (I-V) characteristic of a metal-insulator-metal (MIM) switching element in the MIM-LCD is a hot and difficult problem which has been being studied until now. The I-V characteristic couldn't be described accurately and comprehensively by the conventional Poole-Frenkel equation, so it is difficult to estimate and optimize various parameters to improve the I-V characteristic in experiments. We introduced a p-n-nPLU band model. The model not only explains some experimental phenomena but also has directive function in experiments. By choosing the weak electronegative metal as top-electrode and Ta with acceptor impurity as bottom-electrode, we not only improve the symmetry of the I-V characteristic but also enhance the current ratio of the on-site and off-state.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hongwu Liu, Jianxin Guo, Jianfeng Yuan, Kai Ma, and Xinmin Huang "Current-voltage characteristics of a metal-insulator-metal (MIM) element and its new band model", Proc. SPIE 2892, Display Devices and Systems, (30 September 1996);


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