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3 October 1996 Measurements of electronic nonlinearity of poly-4BCMU waveguide with surface plasma excitation
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Abstract
In this paper, our study is concerned with the metal-clad poly-4 BCMU film waveguide. The Kretschmann configuration of ATR techniques has been used to excite surface plasma wave, and the third nonlinear susceptibility (chi) (3) of the poly-4BCMU film is measured. This method is extremely sensitive for the change of refractive index of the waveguide, it can be served as a useful probe means for monolayer organic films. Another advantage of the method is that the signs of the nonlinear refract index n2NL of the organic film can be obtained in the experiment.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jun Zhou, Yingli Chen, Zhuangqi Cao, Jianhua Liu, Yinqiao Zhao, Heyuan Zhu, Diechi Sun, and Fuming Li "Measurements of electronic nonlinearity of poly-4BCMU waveguide with surface plasma excitation", Proc. SPIE 2897, Electro-Optic and Second Harmonic Generation Materials, Devices, and Applications, (3 October 1996); https://doi.org/10.1117/12.252962
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