Advancement of black-spot method for testing veiling glare

Fengchun Li; Guoyu Zhang; Yujin Gao

doi:10.1117/12.253047

3 October 1996 Advancement of black-spot method for testing veiling glare

Fengchun Li, Guoyu Zhang, Yujin Gao

Proceedings Volume 2899, Automated Optical Inspection for Industry; (1996) https://doi.org/10.1117/12.253047
Event: Photonics China '96, 1996, Beijing, China

Abstract

The veiling glare of an optical system is the major specification for appraising its image quality. Black-spot method for measuring the veiling glare is a currently common-used technique. Instability in the power supply and devices directly affects the measuring accuracy. Comparing the two beams from a same source of light, using a bridge differential circuit, displaying the balance with a galvanometer, and taking the resistance with a precision resistance box, we can calculate the veiling glare index. It is proved by the calculation and experiments that the measuring accuracy is as high as 10^-4.

Citation Download Citation

Fengchun Li, Guoyu Zhang, and Yujin Gao "Advancement of black-spot method for testing veiling glare", Proc. SPIE 2899, Automated Optical Inspection for Industry, (3 October 1996); https://doi.org/10.1117/12.253047

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