20 March 1997 Defect measurement using structured light system
Author Affiliations +
Proceedings Volume 2921, International Conference on Experimental Mechanics: Advances and Applications; (1997) https://doi.org/10.1117/12.269871
Event: International Conference on Experimental Mechanics: Advances and Applications, 1996, Singapore, Singapore
Abstract
Automated machine visual inspection, using non-contact optical means, is a fast and efficient approach for quality control and manufacturing process monitoring. One application is in shape measurement and defect detection which employs a structured light system based on the projection moire method. The fringe patterns of these specimens are obtained by pulsing a single strip of light from a diode laser on the rotating specimens. Defects on these surfaces can be observed when a single strip of light bends proportionally to their depths. The imaging of these fringes is done by a charge coupled device (CCD) camera operating at the time delay and integrating (TDI) mode. By synchronizing the camera scanning speed and the specimen's rotational speed, the 'unwrapped' surface fringe patterns can be obtained and viewed by a computer. The fast Fourier transformation (FFT) technique is used for quantitative measurement of the surface defect.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Siew-Lok Toh, Siew-Lok Toh, W. K. Low, W. K. Low, Cho Jui Tay, Cho Jui Tay, Huai Min Shang, Huai Min Shang, Anand Krishna Asundi, Anand Krishna Asundi, } "Defect measurement using structured light system", Proc. SPIE 2921, International Conference on Experimental Mechanics: Advances and Applications, (20 March 1997); doi: 10.1117/12.269871; https://doi.org/10.1117/12.269871
PROCEEDINGS
6 PAGES


SHARE
RELATED CONTENT

3-D moire contouring with modified CCD-camera
Proceedings of SPIE (October 01 1990)
High-speed TDI imaging for peripheral inspection
Proceedings of SPIE (March 27 1995)
Deformation measurements using projected fringe profilometry
Proceedings of SPIE (October 15 2012)
Agile automated vision
Proceedings of SPIE (November 23 1994)

Back to Top