22 October 1996 Optical admittance loci of GRIN (inhomogeneous) thin films
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Proceedings Volume 2943, Gradient-Index Optics in Science and Engineering; (1996) https://doi.org/10.1117/12.255542
Event: Gradient-Index Optics in Science and Engineering, 1995, Kazimierz Dolny, Poland
Loci of the optical admittance of GRIN thin films are studied. We have investigated by means of the computer modeling, how the trajectory of the loci will change if the layer will have a different inhomogeneity coefficient. During the modeling we have employed a method of discretization of the GRIN layer by dividing the layer to sublayers which have equal thickness and constant refractive index. We have also examined how these loci will be affected by absorption in the layer, determined by different values of the extinction coefficient. Layers are assumed to be deposited on the bare glass substrate or substrate with a quarter- or eight-wave optical thickness layer. Results may be applied to the interpretation of the monitoring signals of the thin-film optical monitors.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Grzegorz Jerzy Kopec "Optical admittance loci of GRIN (inhomogeneous) thin films", Proc. SPIE 2943, Gradient-Index Optics in Science and Engineering, (22 October 1996); doi: 10.1117/12.255542; https://doi.org/10.1117/12.255542

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