15 November 1996 Computer-enhanced photon tunneling microscopy for composite materials characterization and durability assessment
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Abstract
In an effort to reduce cost and maximize the utility of each test specimen, our laboratory has incorporated several types of non-intrusive techniques for surface analysis and sample characterization. The newest and one of the most promising techniques is computer enhanced photon tunneling microscopy. This paper describes our current photon tunneling microscopy system and its use in the characterization of polymer matrix composite materials surfaces. The technique of photon tunneling microscopy was first made available commercially through a licensee of the Polaroid Corporation in 1992. Our system was purchased in 1994 and has been used primarily to study the effects of accelerated aging on composite materials.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James D. Kleinmeyer, James D. Kleinmeyer, } "Computer-enhanced photon tunneling microscopy for composite materials characterization and durability assessment", Proc. SPIE 2948, Nondestructive Evaluation for Process Control in Manufacturing, (15 November 1996); doi: 10.1117/12.259211; https://doi.org/10.1117/12.259211
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