20 December 1996 Modeling and near-field measurements of strip-loaded Er-doped sol-gel waveguides
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Proceedings Volume 2954, Fiber Integrated Optics; (1996) https://doi.org/10.1117/12.262437
Event: Advanced Imaging and Network Technologies, 1996, Berlin, Germany
For integrated optical amplifiers to be efficient, losses must be minimized. An important source of losses comes from the coupling, and it is due to the modal mismatch between the amplifying channel waveguide and the connected fibers. In order to assess the coupling losses of our Er+- doped-glass strip-loaded waveguides, we observed the mode shapes by near-field imaging and compared them with the results of numerical simulations performed by using a 3D Beam Propagation Method. Important information about the critical parameters of the fabrication process have been obtained.
© (1996) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Xavier Orignac, Xavier Orignac, Alessandro Verciani, Alessandro Verciani, Giancarlo C. Righini, Giancarlo C. Righini, Michele A. Forastiere, Michele A. Forastiere, } "Modeling and near-field measurements of strip-loaded Er-doped sol-gel waveguides", Proc. SPIE 2954, Fiber Integrated Optics, (20 December 1996); doi: 10.1117/12.262437; https://doi.org/10.1117/12.262437

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