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13 May 1997 Characterization of optical coatings: damage threshold/local absorption correlation
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Abstract
Simultaneous absorption and scattering mappings are used to study the influence of local defects on the laser damage threshold of thin films. The same area is mapped for absorption an d scatter before and after irradiation at the threshold fluence. The study is performed for an uncoated fused silica substrate and two single-layer films deposited on fused silica substrates at a wavelength of (lambda) equals 1.06 micrometers . Initial results seem to indicate that the irradiation can create and enhance absorption and scattering defects.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Anne Fornier, C. Cordillot, D. Bernardino, Odile Lam, Andre Roussel, Claude Amra, Ludovic Escoubas, Gerard Albrand, and Mireille Commandre "Characterization of optical coatings: damage threshold/local absorption correlation", Proc. SPIE 2966, Laser-Induced Damage in Optical Materials: 1996, (13 May 1997); https://doi.org/10.1117/12.274239
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