6 February 1997 Microhologram recording in amorphous semiconductor films
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Proceedings Volume 2968, Optical Organic and Semiconductor Inorganic Materials; (1997) https://doi.org/10.1117/12.266854
Event: International Conference on Advanced Optical Materials and Devices, 1996, Riga, Latvia
Abstract
The effect of holographic grating (HG) size on their diffraction efficiency (DE) at different spatial frequencies is experimentally studied in amorphous AS-S-Se films. The HG size was changed by focusing the recording beams. It is found that reduction of the size from 1100 micrometer to 150 micrometer increases the maximal DE from 0.9% to 1.8%. Further reduction down to 20 micrometer decreases the maximal DE down to 0.08%. DE at lower spatial frequencies is attenuated more than at higher ones. The observed effects are explained by the nonuniformity of thin HG recorded by Gaussian beams as well as by the curvature of the focused wavefronts and peculiarities of the recording mechanism in As-S-Se films. It is concluded that minimization of hologram size in AS-S-Se films is feasible only down to 150 micrometers.
© (1997) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Andris O. Ozols, Girts Ivanovs, Maris Laudobelis, "Microhologram recording in amorphous semiconductor films", Proc. SPIE 2968, Optical Organic and Semiconductor Inorganic Materials, (6 February 1997); doi: 10.1117/12.266854; https://doi.org/10.1117/12.266854
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