PROCEEDINGS VOLUME 2988
PHOTONICS WEST '97 | 8-14 FEBRUARY 1997
Free-Electron Laser Challenges
PHOTONICS WEST '97
8-14 February 1997
San Jose, CA, United States
Single-Pass FEL Experiments
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 2 (15 May 1997); doi: 10.1117/12.274368
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 15 (15 May 1997); doi: 10.1117/12.274377
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 20 (15 May 1997); doi: 10.1117/12.274387
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 28 (15 May 1997); doi: 10.1117/12.274394
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 38 (15 May 1997); doi: 10.1117/12.274396
X-Ray Issues and Applications
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 48 (15 May 1997); doi: 10.1117/12.274397
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 52 (15 May 1997); doi: 10.1117/12.274398
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 64 (15 May 1997); doi: 10.1117/12.274399
FEL Technology I
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 70 (15 May 1997); doi: 10.1117/12.274369
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 78 (15 May 1997); doi: 10.1117/12.274370
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 90 (15 May 1997); doi: 10.1117/12.274371
Theory and Simulation
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 98 (15 May 1997); doi: 10.1117/12.274372
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 108 (15 May 1997); doi: 10.1117/12.274373
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 112 (15 May 1997); doi: 10.1117/12.274374
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 127 (15 May 1997); doi: 10.1117/12.274375
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 145 (15 May 1997); doi: 10.1117/12.274376
High-Average-Power FEL Experiments and Facilities
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 158 (15 May 1997); doi: 10.1117/12.274378
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 170 (15 May 1997); doi: 10.1117/12.274379
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 176 (15 May 1997); doi: 10.1117/12.274380
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 185 (15 May 1997); doi: 10.1117/12.274381
FEL Technology II
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 232 (15 May 1997); doi: 10.1117/12.274382
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 202 (15 May 1997); doi: 10.1117/12.274383
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 210 (15 May 1997); doi: 10.1117/12.274384
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 221 (15 May 1997); doi: 10.1117/12.274385
Applications of High-Average Power FELs
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 240 (15 May 1997); doi: 10.1117/12.274386
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 245 (15 May 1997); doi: 10.1117/12.274388
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 257 (15 May 1997); doi: 10.1117/12.274389
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 264 (15 May 1997); doi: 10.1117/12.274390
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 272 (15 May 1997); doi: 10.1117/12.274391
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 280 (15 May 1997); doi: 10.1117/12.274392
High-Average-Power FEL Experiments and Facilities
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 188 (15 May 1997); doi: 10.1117/12.274393
Theory and Simulation
Proc. SPIE 2988, Free-Electron Laser Challenges, pg 134 (15 May 1997); doi: 10.1117/12.274395
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